Applications and Metrology at Nanometer-Scale 2 - Measurement Systems, Quantum Engineering and RBDO Method Dublin Core Títol Applications and Metrology at Nanometer-Scale 2 - Measurement Systems, Quantum Engineering and RBDO Method Autor Pierre-Richard Dahoo Matèria Physical Sciences and Engineering Nanotechnology Editor Wiley Data de publicació 2021 Identificador 9781119818984 Font https://onlinelibrary.wiley.com/doi/book/10.1002/9781119818984 Etiquetes Nanotechnology, Physical Sciences and Engineering Col·lecció Physical Sciences and Engineering ← ítem anterior Ítem següent →
